Public Instrumentation Facility

I. Instrument Applications

The X-ray diffractometer is mainly used for phase identification and phase quantification of polycrystalline samples, unit cell parameter calculation, solid-solution analysis, grain analysis, and structural analysis.

II. Main Technical Specifications

1. Maximum output power of the high-voltage generator: 600 W

2. Scanning mode: Theta/Theta vertical goniometer. The sample is placed horizontally and remains level during measurement.

3. Goniometer radius: 160 mm

4. 2θ rotation range: –3° to 145°

5. Minimum step size: 0.005°

6. Semiconductor array detector

III. Reservation Instructions

Testing can be done by sample submission or by operating the instrument independently after passing the training.

IV. Sample Requirements

Powder samples should be ground to 200 mesh, placed in the center of the sample holder, and pressed flat using a glass slide.