Academics

Total Hours: 48

Credits: 3

Assessment: Written Exam

I. Course Introduction

This course builds a multi‑scale characterization framework from atomic to macro levels, focusing on structure–composition–defects–electronic states–dynamics–performance. It covers electron microscopy (SEM/TEM/STEM/EELS), scanning probe microscopy (AFM/STM), X‑ray diffraction, XPS/Raman, ARPES, transport measurements, and large‑scale facilities (synchrotron, neutron scattering). Advanced techniques include 4D‑STEM, operando, and ultrafast pump–probe spectroscopy.

Teaching combines theory, case studies, seminars, and lab visits. Students analyze top‑journal characterization strategies and design research‑driven characterization plans.

II. Textbook

K. M. Krishnan. Principles of Materials Characterization and Metrology. Oxford University Press, 2021.

III. References

[1] Wang Xiaochun, Zhang Xiyan. Modern Analytical and Testing Techniques (2nd ed.). National Defense Industry Press, 2022.

[2] Material Testing Technology and Analytical Methods (3rd ed.). Harbin Institute of Technology Press.